Open AccessResearch on high precision ADC test based on modular hardware
Author(s) -
Tang Yao Xie,
Z. W. Wu,
Yun Wang,
Jianguo Yu
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1920/1/012028
Subject(s) - modular design , computer science , debugging , bottleneck , key (lock) , flexibility (engineering) , test harness , embedded system , computer hardware , interface (matter) , software , computer architecture , computer engineering , operating system , software system , software construction , statistics , mathematics , bubble , maximum bubble pressure method
The design of digital systems in modern communication systems, network transmission systems, and computer multimedia systems has developed by leaps and bounds. The speed and accuracy of the interface circuit between analog and digital have become the key and bottleneck for the vigorous development of digital systems in the future. Correspondingly, the requirements for high-precision ADC performance testing technology and functional verification schemes are also getting higher and higher, and they have gradually been upgraded to an important technical obstacle that needs to be resolved, blocking the innovation of information technology in my country. This thesis first briefly introduces the static and dynamic test principles and techniques of high-precision ADC chips, summarizes the performance indicators of ADCs, and expounds the definitions of commonly used test parameters in more detail. Subsequently, modular equipment was used to build a high-performance test platform and a functional verification platform, and a software and hardware test platform was built with PXI modular equipment as the core to complete the system debugging and data processing of each part. The static parameters, Dynamic parameter indicators are measured and analyzed. The test verification system and research program of this program show that it meets the key index test and functional characteristic verification of high-precision ADC, and its test method has good flexibility, completeness, programmability, and versatility.