Open AccessStudy on National Technical Specification of the Standard Retroreflectivity Measurement Device
Author(s) -
Yue Liu,
Yonggang Zhou,
Zhengwei Leng,
Jinjin Cao,
Chang Liu
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1907/1/012061
Subject(s) - retroreflector , metrology , illuminance , optics , observational error , engineering , statistics , mathematics , physics , laser
Start your abstract here…The study aims to explore the technical specifications of the standard retroreflectivity measurement devices. Based on the measurement principle of retroreflection coefficient, the metrological characteristics of standard retroreflectivity measurement devices were proposed and the three main metrological indices of light source (color temperature, illuminance and positioning error of incident angle) were experimentally explored. The allowable error range of the retroreflection coefficient measurements was determined to calculate the corresponding ranges of metrological indices. With the entropy weight method, the weight of the influence of each index on retroreflection coefficient measurements was analyzed. The analysis results showed that the illuminance had the most significant influence on the retroreflection coefficient and accounted for 41.30%, followed by color temperature (34.43%) and angle change (24.26%). The study provides the important technical support for the development of technical specifications of standard retroreflectivity measurement devices.