
Ti K-edge XANES and Pb LIII-edge EXAFS studies of PbZr0.40Ti0.60O3ferroelectric material
Author(s) -
Alexandre Mesquita,
Alain Michalowicz,
Valmor Roberto Mastelaro
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/190/1/012081
Subject(s) - xanes , x ray absorption fine structure , extended x ray absorption fine structure , tetragonal crystal system , materials science , rietveld refinement , crystal structure , crystallography , ferroelectricity , k edge , absorption (acoustics) , analytical chemistry (journal) , crystal (programming language) , x ray crystallography , absorption spectroscopy , spectral line , diffraction , chemistry , spectroscopy , optics , physics , programming language , optoelectronics , astronomy , computer science , composite material , chromatography , quantum mechanics , dielectric