Open AccessAn automated measuring complex of electromagnetic parameters of materials in the field of superhigh frequencies
Author(s) -
Д. А. Голенцов,
Vyacheslav Flanden,
M. Solntseva
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1891/1/012046
Subject(s) - electromagnetic field , metrology , field (mathematics) , range (aeronautics) , work (physics) , acoustics , electromagnetic radiation , magnetic field , computer science , physics , mechanical engineering , optics , engineering , aerospace engineering , mathematics , quantum mechanics , pure mathematics
This work is dedicated to the features of measuring the electromagnetic parameters of materials. In the field of superhigh frequencies, there are practically no documents regulating the requirements for the properties of materials and means for measuring the electromagnetic parameters of materials. To solve the problems of metrological support for this frequency range and new materials, several steps are required. One of them is the development of a measuring complex. This work describes the composition of the developed model of such a complex and its distinctive features. The text contains models of materials. The extended frequency ranges from 200 MHz to 80 GHz. The range of external magnetic fields has been expanded from 4 kA/m to 70 kA/m.