Open AccessResearch on Manufacturing Readiness Level Improvement of Hybrid Integrated Circuit Based on Intelligent Manufacturing
Author(s) -
Hailong Zhao,
Zhang Yu,
Kui Zhang,
Jie Huang,
Honglei Ran
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1884/1/012016
Subject(s) - connotation , manufacturing engineering , internet of things , computer science , process (computing) , computer integrated manufacturing , grading (engineering) , research object , big data , manufacturing , engineering , systems engineering , data mining , embedded system , business , business administration , philosophy , linguistics , civil engineering , marketing , operating system
This paper takes Hybrid Integrated Circuit (HIC) as research object, on the basis of fully understanding the concept and connotation, grading requirements and evaluation process of Manufacturing Readiness Level (MRL), aiming at the manufacturing risk factors and its sub factors in MRL, based on intelligent manufacturing technology, several ways to improve MRL of HIC are discussed, including intelligent upgrading of manufacturing equipment, intelligent management system, intelligent warehousing and logistics, intelligent interaction of Internet of Things (IOT), big data analysis and mining.