Open AccessReliability of n-Cascade Stress-Strength P(X<Y<Z) System for four different distributions
Author(s) -
Nada S. Karam,
Shahbaa M. Yousif
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1879/3/032005
Subject(s) - cascade , rayleigh distribution , exponential function , reliability (semiconductor) , mathematics , stress (linguistics) , exponential distribution , physics , statistics , mathematical analysis , thermodynamics , probability density function , engineering , power (physics) , linguistics , philosophy , chemical engineering
In this paper, the n-cascade with P(X<Y<Z) is used to find the reliability of stress-strength system, where X and Z are the strengths of a component subjected to stress Y. The n-cascade stress-strength system reliability expression is obtained for four different distributions which are [Exponential Pareto, Inverted Exponential, Exponentiated Invers Rayleigh, Frechet]. For some specific values of the parameters of the distribution, the numerical values of the four different reliabilities have also been computed, provided, and discussed.