Open AccessNear-edge X-ray absorption fine structure measurements using a laser plasma XUV source
Author(s) -
Christian Peth,
Frank Barkusky,
Julia Sedlmair,
S. C. Gleber,
Eva Nováková,
J. Niemeyer,
Juergen Thieme,
Tim Salditt,
Klaus Mann
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/186/1/012032
Subject(s) - extreme ultraviolet , laser , plasma , synchrotron , absorption (acoustics) , materials science , enhanced data rates for gsm evolution , absorption edge , synchrotron radiation , carbon fibers , absorption spectroscopy , spectroscopy , synchrotron radiation source , analytical chemistry (journal) , optics , atomic physics , chemistry , optoelectronics , physics , nuclear physics , chromatography , quantum mechanics , band gap , composite number , computer science , composite material , telecommunications