
First application experiments with the Stockholm compact soft x-ray microscope
Author(s) -
Michael Bertilson,
Olov von Hofsten,
Jürgen Thieme,
Magnus Lindblom,
Anders Holmberg,
Per Takman,
U. Vogt,
Hans M. Hertz
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/186/1/012025
Subject(s) - microscope , x ray , materials science , optics , physics