
The potential of an EBIT in assisting plasma diagnostics and progress at the Shanghai EBIT
Author(s) -
Yaming Zou,
R. Hutton
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/185/1/012060
Subject(s) - electron beam ion trap , plasma , instrumentation (computer programming) , inertial confinement fusion , atomic physics , physics , nuclear engineering , cathode ray , engineering , nuclear physics , electron , computer science , operating system