Open AccessRadar methods for determining the thickness of dielectric layers
Author(s) -
I. S. Tseplyaev,
D V Davidenko
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1843/1/012023
Subject(s) - refractive index , amplitude , optics , dielectric , geometrical optics , planar , materials science , radar , refractive index profile , physics , computer science , optoelectronics , telecommunications , computer graphics (images)
This paper describes two methods, the amplitude method and the method based on geometric optics. The methods were applied to practical data obtained by georadar tests. As a result, the refractive index and thickness of the investigated planar layered medium were calculated. When using the amplitude method, the refractive index of the investigated medium is 1.3, the thickness is 0.11 m. When using the method based on geometric optics, the refractive index of the investigated medium is 1.43, the thickness is 0.102 m. After comparing the results of these methods, it was found that the error of the amplitude method is higher than that of the geometrical optics method.