Open AccessField emission scanning electron microscopy combined with focused ion beam for rubbery material with nano-matrix structure
Author(s) -
Keiichi Akabori,
Yasuhiko Yamamoto,
Seiichi Kawahara,
Hiroshi Jinnai,
Hideo Nishioka
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/184/1/012027
Subject(s) - materials science , scanning electron microscope , copolymer , nano , focused ion beam , etching (microfabrication) , field electron emission , matrix (chemical analysis) , ion , analytical chemistry (journal) , chemical engineering , composite material , polymer , electron , chemistry , chromatography , physics , organic chemistry , engineering , layer (electronics) , quantum mechanics