Open AccessAnalysis on Stress Screening of Components in Digital Background
Author(s) -
Juan Wei,
Hao Sun,
Jie Chen
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1828/1/012100
Subject(s) - stress (linguistics) , screening test , selection (genetic algorithm) , electronic component , computer science , reliability engineering , engineering , medicine , artificial intelligence , mechanical engineering , family medicine , philosophy , linguistics
This paper introduces various common defects and corresponding screening methods of electronic components. Aiming at the temperature cycle and random vibration methods with good screening effect, the calculation formula of accelerating factor and screening strength in highly accelerated stress screening (HASS) test is introduced. Based on the above discussion, the stress screening test steps of electronic components are summarized to guide the selection of reasonable stress screening items and levels for electronic components.