
Atomic force microscopy study of nanocrystalline ceria thin films
Author(s) -
T. Ristoiu,
T. Petrişor,
M. S. Gabor,
M. Năsui,
B Mos,
L. Ciontea,
T. Petrişor
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/182/1/012015
Subject(s) - nanocrystalline material , atomic force microscopy , materials science , thin film , microscopy , nanotechnology , optics , physics