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Study of the Effect of Doping with Alumina and Silica the Structural and Electrical Properties of Epoxy
Author(s) -
Suroor N. Esmaeel,
Lamyaa M. Raoof,
Hala F. Dagher,
Itab F. Hussein
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1818/1/012043
Subject(s) - crystallization , materials science , epoxy , amorphous solid , dielectric , doping , composite material , conductivity , electrical resistivity and conductivity , chemical engineering , crystallography , chemistry , electrical engineering , optoelectronics , engineering
Crystalline structure of a sample of Alumina (Al 2 O 3 – reinforced epoxy) at (4% and 8%) has two prominent peaks at point (17°) and (19.5°) with miller vectors (111) and (220), respectively. These results are corresponding to crystalline cubic and notes growing of crystallization. The spectrum of (XRD) showed increase in crystalline size which means an increase in randomization and a lack of crystallization amorphous at (6%) (Al 2 O 3 ). This result showed increase in crystalline size which means an increase in randomization and a lack of crystallization amorphous. Epoxy matrix reinforced by particles of silica (SiO 2 ) and alumina (Al 2 O 3 ) with different fractions were investigated for electrical properties such as dielectric constant, conductivity and dielectric loss index. This result showed effect of additional (SiO 2 , Al 2 O 3 ) is small concentration except (2% SiO 2 ) has large effect.

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