
Degradation analysis and optimization of temperature effect on MEMRISTOR-based Neural Network Accelerators by electro-thermal simulation
Author(s) -
Mengjun Shang,
Longxiang Yin,
Ning Xu
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1812/1/012025
Subject(s) - memristor , artificial neural network , computation , computer science , thermal , power (physics) , degradation (telecommunications) , electronic engineering , artificial intelligence , algorithm , engineering , physics , telecommunications , quantum mechanics , meteorology
Nowadays, memristor-based neural network accelerators have been widely studied due to their outstanding performance in massive parallel vector matrix multiplication. However, the memristor is sensitive to temperature and its on/off state operation window can be seriously degraded by the increasing temperature, which may lead to computation failures in memristor -based NN accelerators. In this work, we establish an electro-thermal simulation platform to evaluate the temperature impact on memristor -based NN accelerators. With this platform, we first investigate the impact on computation accuracy with the temperature increase in different NN layers in the accelerators. We then apply a temperature-aware NN weight mapping scheme to the most temperature-sensitive layer and achieve 28.89% improvement in computation accuracy, which only has 0.06% difference with the improvement achieved by applied the mapping scheme to the whole NN model. This finding can help to simplify the temperature-aware hardware optimization design in memristor-based neural network accelerators and reduce the power consumption.