Open AccessX-ray Image Processing Method for Buffer Layer Defect in High Voltage Cable
Author(s) -
Jun Zhang,
Fuyong Huang,
Sanwei Liu,
Zeyu Zeng,
F.S. Chao,
Yi Xie
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1792/1/012046
Subject(s) - buffer (optical fiber) , layer (electronics) , high voltage , voltage , materials science , image processing , contrast (vision) , image (mathematics) , computer science , optics , electrical engineering , composite material , engineering , artificial intelligence , physics
The original X-ray image of the high voltage XLPE insulated cable has low contrast due to its complexity and the limited imaging conditions. Therefore, an X-ray image processing method is proposed to address the high voltage cable’s buffer layer defect detection. One hundred seventy-seven high-resolution images from a cable tunnel are collected. The results indicated that our method could efficiently detect buffer layer defects.