Open AccessTransmission electron microscopy for evaluating the structural parameters of nanoparticles
Author(s) -
N. S. Zakharov,
А. Н. Попова,
Yu. A. Zakharov,
В. М. Пугачев,
D. М. Russakov
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1749/1/012011
Subject(s) - transmission electron microscopy , bimetallic strip , nanoscopic scale , materials science , diffraction , nanoparticle , phase (matter) , electron microscope , transmission (telecommunications) , nanotechnology , microscopy , energy filtered transmission electron microscopy , electron diffraction , work (physics) , crystallography , scanning transmission electron microscopy , optics , chemistry , physics , computer science , metallurgy , metal , thermodynamics , telecommunications , organic chemistry
In this work, on the example of bimetallic systems FePt and FePd, an approach is developed to assessing the structural parameters of nanoscale mono-and polymetallic systems by transmission electron microscopy (TEM), in comparison with the X-ray diffraction method of analysis. The interplanar distances, average sizes and phase compositions of FePt and FePd nanosystems are calculated.