Open AccessComparative assessment of documentation referred to surface roughness measurement
Author(s) -
A. A. Vinogradova,
M I Grichukha,
Evgeniya Smirnova
Publication year - 2021
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1728/1/012025
Subject(s) - gost (hash function) , stylus , surface roughness , surface finish , profilometer , materials science , calibration , measuring instrument , measurement uncertainty , computer science , mathematics , composite material , statistics , computer vision , physics , thermodynamics , computer security
The research relates to the field of metrological supervision, specifically to the control of surface roughness parameters. The authors analyzed the following regulatory documents: GOST R ISO 4287-2014 “Geometrical product specifications (GPS). Surface texture. Profile method. Terms, definitions and surface texture parameters”, GOST 25142-82 “Surface roughness. Terms and definitions”, GOST 2789-73 “Surface roughness. Parameters and characteristics”, GOST 9378-93 (ISO 2632-1-85, ISO 2632-2-85) “Roughness comparison specimens. General technical conditions”, GOST 27964-88 (ST SEV 6134-87, ISO 4287 / 2-84) “Measurement of roughness parameters. Terms and definitions”, GOST 19300-86 “Instruments for measurement of surface roughness by the profile method. Contact profilographs and profilometers. Types and main parameters”, GOST R 8.651-2009 ISO “State system for ensuring the uniformity of measurements. Contact (stylus) instruments for the measurement of surface roughness. Procedure of calibration”, GOST 9847-79 “Optical instruments for surface roughness parameters measuring. Basis parameters and types”, GOST R 8.700-2010 “State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope”, which regulate the measured parameters of the surface roughness, instruments that measure these parameters. In the course of a comparative analysis of the values of the parameters of existing devices and the values of the parameters of devices prescribed in the standards, a summary table was formed, and the problem of controlling nanoparameters and nanocoatings was also identified. The existing instrument base for monitoring surface roughness allows measuring parameters with high accuracy and within wide limits, but the regulatory framework on the territory of the Russian Federation is outdated and does not allow the use of some modern types of instruments. In this regard, it is necessary to update the requirements of GOSTs for the modern capabilities of technology and control over roughness parameters.