
Investigation of microdisk and microring lasers based on InGaAs/GaAs QWDs by the interferometry method
Author(s) -
Alexei Vinogradov,
E. I. Moiseev,
N. V. Kryzhanovskaya,
N. A. Fominykh,
F. I. Zubov,
M. M. Kulagina,
S. A. Mintairov,
N. A. Kalyuzhnyĭ,
M. V. Maximov,
A. E. Zhukov
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1695/1/012093
Subject(s) - interferometry , laser , resonator , optics , optoelectronics , materials science , line width , line (geometry) , quantum well , ranging , gallium arsenide , physics , telecommunications , computer science , geometry , mathematics
The scanning interferometer method is used to measure the line width of microdisk and microring lasers with a diameter of the resonator ranging from 15 to 50 μm and active area based on InGaAs/GaAs quantum well-dots. Above the threshold, the spectral width of the line did not exceed 3 pm for all samples under study.