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Identification of the additional transition around the E0critical point in photoreflectance spectra of GaInAsSb epitaxial films
Author(s) -
L. TiradoMejía,
J. J. PríasBarragán,
Jose F Gómez,
Hernando Ariza Calderón
Publication year - 2009
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/167/1/012022
Subject(s) - epitaxy , spectral line , full width at half maximum , critical point (mathematics) , exciton , derivative (finance) , materials science , analytical chemistry (journal) , condensed matter physics , oscillation (cell signaling) , optics , crystallography , chemistry , optoelectronics , physics , nanotechnology , layer (electronics) , astronomy , mathematical analysis , biochemistry , mathematics , chromatography , financial economics , economics

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