Open AccessQuality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range
Author(s) -
A. K. Nikitin,
O. V. Khitrov,
V. V. Gerasimov
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1636/1/012037
Subject(s) - terahertz radiation , surface plasmon , interferometry , surface plasmon polariton , michelson interferometer , materials science , optics , dielectric , optoelectronics , surface (topology) , localized surface plasmon , surface wave , quality (philosophy) , range (aeronautics) , plasmon , physics , geometry , mathematics , quantum mechanics , composite material
The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.