Open AccessSystem-level fault diagnosis method based on test model
Author(s) -
Wei Cong,
Huan Yu,
Jing Liu
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1629/1/012088
Subject(s) - troubleshooting , fault (geology) , fault coverage , fault model , computer science , reliability engineering , stuck at fault , test (biology) , real time computing , engineering , fault detection and isolation , artificial intelligence , electronic circuit , actuator , electrical engineering , seismology , geology , paleontology , biology
Aiming at the problems of many test states and uncertain test results in system-level fault diagnosis, a system-level fault diagnosis method based on test model is proposed. This method first divides the system nodes into multiple regions, then hierarchically organizes the regions, and implements a top-down hierarchical structure through the control nodes. On this basis, the guide words are used to describe system-level failure modes, formulate centralized test rules, and use data flows to identify failure modes caused by fault propagation and fault mutation, which reduces the state of fault testing and improves the accuracy of fault diagnosis. The example analysis shows that the method in this paper can meet the needs of system-level fault diagnosis, and has practical application value for shortening the time of system fault determination and improving the accuracy of troubleshooting.