Open AccessResearch on the Determination Method of Acceleration Coefficient in Accelerated Reliability Test of Electronic Equipment
Author(s) -
Ming Yang,
Meisheng Yi,
Gengxing Luo,
Yuanmin Huang
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1607/1/012003
Subject(s) - reliability (semiconductor) , reliability engineering , acceleration , electronic equipment , test method , test (biology) , computer science , engineering , statistics , mathematics , computer hardware , paleontology , power (physics) , physics , classical mechanics , quantum mechanics , biology
This paper analyzes the relationship between environmental stress and electronic equipment failure, studies the determination method of stress type, combination mode and stress value in reliability accelerated test of electronic equipment. Under given reliability accelerated test section, the acceleration coefficient calculation method of the reliability of electronic equipment are given, it can realize rapid assessment of highly reliable electronic equipment reliability, significantly reduce test time and test cycles, overcome traditional electronic equipment reliability test time is long, high cost, difficult to quickly evaluate the level of reliability of faults.