Open AccessMultilevel model of time dependences of acoustic emission parameters as the basis for nanodiagnostics of the state of technical objects
Author(s) -
В. В. Носов,
Artem P. Artyushchenko,
S. A. Peretyatko,
E. D. Khokhlova
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1582/1/012067
Subject(s) - acoustic emission , reliability (semiconductor) , computer science , macro , basis (linear algebra) , materials science , acoustics , physics , mathematics , power (physics) , geometry , quantum mechanics , programming language
The method of acoustic emission (AE) and the information-kinetic approach to AE diagnostics are identified as the most promising from the point of view of observing the process of growth of damage and optimization of production technologies. Based on a multi-level model of the time dependence of AE parameters, estimation of elastic homogeneous fracture intensity parameters of representative structural elements of a product and universal strength nanoconstants, the approach combines the traditional experimental way of resource estimation and kinetic representations of fracture. This allows to separate the effect of macro- and nano-factors on the AE of the material, variously related to the strength and acoustic emission activity of the material. A multilevel model and an informational-kinetic approach to acoustic emission diagnostics are described, combining nano-, micro- and macro-factors affecting acoustic emission activity, reliability of technical objects and methods for assessing their resource. On the example of a welded pressure vessel, the implementation of the method of its nano-diagnosis is considered. The possibility of effective resource estimation of various technical objects based on the information-kinetic approach to their acoustic emission diagnostics is shown. As a methodological basis, a multilevel model of the time dependences of the AE parameters is taken, which describes their behavior under conditions of strength and metrological heterogeneity.