Open AccessResearch on CCD High-speed Data Acquisition and Computer Simulation Processing System Controlled by Single Chip Microcomputer
Author(s) -
Huang Xiu-li
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1574/1/012049
Subject(s) - eeprom , microcomputer , computer hardware , computer science , charge coupled device , liquid crystal display , data acquisition , photoelectric sensor , field programmable gate array , chip , reliability (semiconductor) , microcontroller , electronic circuit , integrated circuit , electronic engineering , embedded system , electrical engineering , engineering , telecommunications , power (physics) , physics , quantum mechanics , optics , operating system
CCD (charge-coupled device) is a unique performance of the semiconductor photoelectric device, CCD technology applied to displacement, thickness and other geometric measurement, can achieve high precision, online dynamic detection and non-contact measurement requirements. This system USES the method of combining FPGA and single chip microcomputer to measure the thickness of the object using CCD as the sensor. In this design, the CCD driver pulse circuit, control logic and calculation circuit are all integrated in FPGA chip, thus improving the reliability of the system and creating conditions for the system integration. External display and control circuits such as liquid crystal display, keyboard and EEPROM memory are designed by SCM. The whole system embodies the characteristics of high integration, simple structure and superior performance. This paper introduces the principle, design and implementation of the system in detail.