
Interaction of electromagnetic H-wave with thin conducting film taking into account anisotropy of isoenergetic surface of conductor
Author(s) -
И. А. Кузнецова,
Д. Н. Романов,
А. А. Yushkanov
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1560/1/012010
Subject(s) - specularity , conductor , reflection (computer programming) , perfect conductor , electromagnetic radiation , condensed matter physics , degenerate energy levels , anisotropy , absorption (acoustics) , plane wave , electrical conductor , surface wave , physics , dielectric , boundary value problem , optics , electromagnetic field , surface (topology) , electric field , materials science , specular reflection , quantum mechanics , scattering , geometry , composite material , computer science , programming language , mathematics
The coefficients of reflection, absorption and transmission of electromagnetic H-wave with thin conducting film located between two dielectric environments are calculated in the framework of the kinetic theory in this article. The case of an anisotropic isoenergetic surface of a conductor is considered. The electromagnetic wave is incident onto the upper surface of the film at an arbitrary angle. The case of different specularity coefficients when reflecting electrons (holes) from the lower and upper surfaces of the film is considered. The isoenergetic surface of the conductor is a three-axis ellipsoid, one main axis of which is parallel to the normal to the boundary of the film, and the other to the electric field of the incident electromagnetic wave. The analysis of the dependences of the reflection, absorption and transmission coefficients on the effective mass for degenerate and non-degenerate gas of free charge carriers is carried out.