Open AccessStudy of Cluster Test of Complex Circuits
Author(s) -
Zhiwei Li,
Pan Zhang
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1549/5/052008
Subject(s) - boundary scan , automatic test pattern generation , test (biology) , electronic circuit , computer science , cluster (spacecraft) , fault coverage , test compression , design for testing , interconnection , boundary (topology) , fault (geology) , computer engineering , algorithm , reliability engineering , electronic engineering , integrated circuit , engineering , electrical engineering , mathematics , telecommunications , paleontology , mathematical analysis , testability , seismology , geology , biology , operating system , programming language
Cluster test of complex circuits is very difficult. The paper uses boundary scan test technology, different test algorithm, and test method for performing output operations on the boundary scanning units at each end of the interconnect network, and does a lot of test and analysis, effectively solves the problems of cluster test of complex circuits, and gives high fault resolution.