Open AccessThe automating of the quantitative analysis and characterization of the polymer based films surfaces SEM-images
Author(s) -
Г. О. Рытиков,
Ф. А. Доронин,
И. В. Нагорнова,
Л. Г. Варепо,
Yu.V. Rudyak,
V. G. Nazarov
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1546/1/012027
Subject(s) - scanning electron microscope , characterization (materials science) , polymer , materials science , planar , digital image , universality (dynamical systems) , polyethylene , computer science , digital image analysis , image processing , engineering drawing , computer vision , nanotechnology , composite material , computer graphics (images) , image (mathematics) , engineering , physics , quantum mechanics
It is represented a possible way to standardize and to automate the quantitative description and the analysis of the formed by the scanning electron microscope polymer based films surfaces’ images. Also there are the calculating algorithms for the topographic model forming and the degrees of planar and contour digital heterogeneities calculating and the analysis process model with the computer application interface and the corresponded results of the sulfonated and fluorinated low-density polyethylene films SEM-images’ characterization. Due to the universality of the proposed techniques for quantitative image description and simulating they can be used in quality control systems under the design and manufacture of the surface-modified polymer films.