Open AccessThe techniques analysis of the heterogeneous modified polymer materials parameters detection
Author(s) -
И. В. Нагорнова,
Ф. А. Доронин,
Л. Г. Варепо,
Г. О. Рытиков,
А. Г. Евдокимов,
V. G. Nazarov
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1546/1/012022
Subject(s) - polymer , microfluidics , materials science , x ray photoelectron spectroscopy , electronics , microstructure , process (computing) , surface modification , layer (electronics) , fourier transform infrared spectroscopy , nanotechnology , process engineering , biological system , computer science , chemical engineering , composite material , chemistry , engineering , biology , operating system
The comparative analysis of the most popular techniques features (SEM, EDS, XPS, FTIR) applied for the quality monitoring of the polymer materials modification process is carried out as exemplified by the both 3D-microfluidics and flexible printed electronics substrates manufacturing. The typical errors at the both microstructure and composition instrumental analysis of the modified heterogeneous near-surface layer of the polymer material are listed. The reasonability of the cyclic chemical as well as morphological statistically significant technique of the date acquisition accompanied by the source generation signal gradient variation is shown. The developed general algorithm of the polymer modification process instrumental monitoring is presented.