Open AccessFormation and characterisation of cobalt depleted outermost layer of WC–Co composite materials
Author(s) -
Peter Rugóczky,
Gábor Muránszky,
Gábor Lassú,
János Lakatos
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1527/1/012025
Subject(s) - cobalt , materials science , composite number , layer (electronics) , etching (microfabrication) , diamond , tungsten carbide , analytical chemistry (journal) , composite material , metallurgy , chemistry , chromatography
The cobalt depleted layer of WC–Co composite materials was investigated after selective cobalt etching in diluted Caro’s acid. The time dependence of Co etching and the thickness of the etched layer was determined by using Glow Discharge Optical Emission Spectrometer (GD-OES) depth profiling as well as by calculation method based on determination of the dissolved Co by Atomic Absorption Spectrophotometric (AAS) measurement. The integrity of the modified outermost layer of the WC–Co composite materials were qualified using Rockwell C indentation test. This test methods were found usable for optimisation of the pre-treatment applied before the diamond thin film deposition.