Open AccessSoft measurements in technological processes control
Author(s) -
Л. П. Вершинина,
М. И. Вершинин
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1515/5/052023
Subject(s) - microprocessor , metrology , process (computing) , computer science , control (management) , control system , system of measurement , process control , base (topology) , systems engineering , control engineering , manufacturing engineering , engineering , embedded system , electrical engineering , artificial intelligence , mathematics , physics , statistics , astronomy , operating system , mathematical analysis
Intelligent information and measurement systems, microprocessor control of measurement procedure cause increasing role of metrological aspect in technological process control. The role of soft measurements in improving the methodological base of measuring systems is shown. Examples of the implementation of the concept of soft measurements and calculations in the development of mathematical support of automated technological process control system for the production of radio electronic means are given.