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Measurement of oxide coating thickness in the micro-arc oxidation process
Author(s) -
P. E. Golubkov,
E. А. Pecherskaya,
T. O. Zinchenko,
В. А. Баранов,
G. V. Kozlov,
Yuliya V. Shepeleva
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1515/4/042067
Subject(s) - oxide , materials science , coating , metrology , process (computing) , measure (data warehouse) , transducer , computer science , composite material , metallurgy , optics , engineering , electrical engineering , physics , database , operating system
The requirements to methods for measuring the oxide coatings thickness are formulated, allowing measurements to be carried out directly in the process of their formation in real time, which is a necessary condition for the controlled synthesis of coatings with desired properties. Based on a systematic approach, the existing methods for measuring the oxide coatings thickness and their metrological characteristics are analyzed. As a result, it was found that the most suitable for measuring the oxide coatings thickness during micro-arc oxidation are electrical methods, which include the method proposed by the authors based on a frequency integrating scanning transducer. The method proposed by authors allows to measure the thickness of the oxide layers directly in the process of their formation with high accuracy. This method is implemented in an intelligent automated system for the controlled synthesis of oxide coatings.

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