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Automatic device for testing thermal resistance with thermoelectric effect
Author(s) -
I M Vasiliev,
А. И. Солдатов,
Alexey Dementiev,
А. И. Солдатов,
A. A. Abouellail
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1499/1/012047
Subject(s) - thermal resistance , radiator (engine cooling) , materials science , thermal , thermoelectric effect , thermoelectric cooling , semiconductor , interface (matter) , composite material , mechanical engineering , optoelectronics , engineering , thermodynamics , physics , capillary number , capillary action
This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.

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