Open AccessNDT/NDE by means of a probabilistic differential compressive sensing method
Author(s) -
Giorgio Gottardi,
Mohammad Abdul Hannan,
Alessandro Polo
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1476/1/012006
Subject(s) - nondestructive testing , inverse problem , robustness (evolution) , probabilistic logic , solver , compressed sensing , computer science , inverse scattering problem , bayesian probability , inverse , microwave imaging , algorithm , microwave , artificial intelligence , mathematics , physics , telecommunications , geometry , mathematical analysis , biochemistry , chemistry , quantum mechanics , gene , programming language
A novel microwave imaging ( MI ) method is proposed to deal with the nondestructive testing and evaluation ( NDT/NDE ) of dielectric structures. The proposed technique exploits a probabilistic differential contrast source inversion ( D-CSI ) formulation of the inverse scattering ( IS ) problem, which is then effectively solved by means of a customized multi-task Bayesian compressive sensing ( MT-BCS ) solver. Numerical results are shown to assess the effectiveness and robustness of the proposed NDT/NDE method, as well as to compare it. with a single-task ( ST-BCS ) implementation within the same framework.