Open AccessCharacterisation of ion bunches by a single-pass non-destructive charge counter
Author(s) -
Markus Kiffer,
Stefan Ringleb,
N Stallkamp,
S. Kumar,
B Arndt,
Manuel Vogel,
W. Quint,
Th. Stöhlker
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1412/24/242004
Subject(s) - bunches , ion , kinetic energy , atomic physics , charge (physics) , energy (signal processing) , highly charged ion , electrode , low energy , materials science , physics , ion source , electron , nuclear physics , quantum mechanics
Synopsis We present non-destructive single-pass ion bunch detection and characterisation by measuring the induced image charge in a detection electrode. The presented technique allows direct determination of ion kinetic energy, absolute ion number and spatial ion bunch length. We will show the results of corresponding measurements with bunches of low-energy highly charged ions and discuss the minimum detectable number of charges.