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Photoionization of endohedrals: complete semi-phenomenological approach
Author(s) -
M. Ya. Amusia,
Л. В. Чернышева
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1412/20/202025
Subject(s) - photoionization , pseudopotential , atomic physics , electron , physics , random phase approximation , polarization (electrochemistry) , photon , atom (system on chip) , charge exchange , quantum mechanics , ionization , chemistry , computer science , ion , embedded system
Synopsis We developed a semi-phenomenological approach that permits to calculate the photoionization cross section of an endohedral A@C N . We take, along with the static pseudopotential of atom A and fullerene C N also the static and dynamic polarization of A and C N by the incoming photons and outgoing electrons. The approach is general and applicable to any spherically-symmetric endohedrals. Concrete results are obtained for Ar@C 60 and Xe@C 60 . We take into account the multi-electron correlations in the frame of the random phase approximation with exchange (RPAE).

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