
Electron–beam ion trap/source for ion–molecule collisions in the non-perturbative regime
Author(s) -
B. Bapat,
Deepak Sharma,
Sumit Srivastav
Publication year - 2020
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1412/15/152070
Subject(s) - ion , atomic physics , electron beam ion trap , electron , ion trap , trap (plumbing) , physics , ion source , beam (structure) , molecule , ion beam , penning trap , cathode ray , nuclear physics , optics , quantum mechanics , meteorology
Synopsis An Electron Beam Ion Trap and Source has been installed at the Indian Institute of Science Education and Research Pune. The source, manufactured by Dreebit GmbH, will provide ions up to Ar 16+ at energies up to 30 keV/q. These will be used for studying ion-molecule collisions in the non-perturbative regime.