Open AccessWire-free method of measurements of weak electrostatic values under stationary and dynamic conditions
Author(s) -
Kh. F. Makhmudov
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1400/7/077057
Subject(s) - electrometer , measure (data warehouse) , amplifier , dielectric , operational amplifier , acoustics , relaxation (psychology) , voltage , materials science , electric field , time constant , sensitivity (control systems) , electronic circuit , mechanics , electrical engineering , electronic engineering , physics , computer science , optoelectronics , optics , engineering , psychology , social psychology , cmos , quantum mechanics , database
Usage of a developed and updated electrometer (EM) allows one, first, to obtain new information on physical properties of materials (glasses and other solids) as well as on the manifestation of the properties in the field of mechanical forces. Second, the applicational significance of such researches could be also important when designing new nondestructive methods of material defects controlling and procedures of their removal. The EM is up to measure both slowly and rapidly varying electric potentials at some distance from a target. EM allows one measure relaxation times of charges in dielectrics, which do not exceed the time constant of discharge time of the amplifier under stationary conditions. Owing to the developed scheme of the EM input circuit, the input capacity of amplifier was decreased with a corresponded increase of its sensitivity.