
Investigation of the converse flexoelectric effect in KTaO3 using the interferometric microscopy method
Author(s) -
E. D. Obozova,
A. D. Polushina,
В. Г. Залесский,
П. П. Сырников
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1400/7/077007
Subject(s) - converse , materials science , interferometry , electric field , optics , microscopy , bending , field (mathematics) , condensed matter physics , composite material , physics , geometry , mathematics , quantum mechanics , pure mathematics
The inhomogeneous strain induced by an external electric field (the converse flexoelectric effect) has been studied in thin KTaO3 single crystal plates by a scanning interferometric microscopy method. It has been shown that the type of inhomogeneous strain (spherical and cylindrical bending) is determined by the direction of the applied field along [001] and [011] crystallographic directions.