Open AccessResonant Bragg reflection of light from ZnTe-based structures with embedded CdTe monolayers
Author(s) -
T. A. Ukleev,
A. Reznitsky,
A. V. Sel’kin
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1400/6/066001
Subject(s) - materials science , monolayer , cadmium telluride photovoltaics , reflection (computer programming) , planar , optoelectronics , bragg's law , semiconductor , optics , wavelength , band gap , spectral line , diffraction , nanotechnology , physics , computer graphics (images) , astronomy , computer science , programming language
An electrodynamic model describing Bragg reflection of light from semiconductor structures with ultrathin planar layers embedded in bulk material matrix is developed. The layers are assumed to exhibit resonant optical properties in a spectral range near the short-wavelength bandgap edge of bulk material. Model calculations of the reflection spectra are performed at typical parameter values of the resonant Bragg structure containing monolayers of CdTe in bulk ZnTe.