
Analysis of XPS and REELS spectra of beryllium
Author(s) -
В. П. Афанасьев,
A. S. Gryazev,
P. S. Kaplya,
Olga Ridzel,
A. V. Rybakova
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1370/1/012063
Subject(s) - x ray photoelectron spectroscopy , spectral line , beryllium , atomic physics , spectroscopy , electron energy loss spectroscopy , electron spectroscopy , materials science , analytical chemistry (journal) , computational physics , chemistry , electron , physics , nuclear magnetic resonance , nuclear physics , quantum mechanics , astronomy , chromatography
The differential inverse inelastic mean free paths (DIIMFP) of beryllium were derived from energy spectra acquired using X-ray photoelectron spectroscopy and electron energy loss spectroscopy techniques by means of the fitting of calculated spectra to experimental data. The calculation of the energy spectra is performed employing the partial intensity approach (PIA). The EELS and XPS spectra were acquired in different laboratories using different Be samples. The comparison of the obtained DIIMFPs with literature data is presented.