Open AccessAnalytical calculation of diffraction order intensities for a hyperspectrometer
Author(s) -
A. A. Rastorguev,
S. I. Kharitinov
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1368/2/022050
Subject(s) - diffraction , optics , wavelength , blazed grating , diffraction grating , grating , eikonal equation , diffraction efficiency , physics , reflection (computer programming) , acousto optics , ray , angle of incidence (optics) , field (mathematics) , geometrical optics , mathematics , computer science , quantum mechanics , pure mathematics , programming language
We employ a geometric optics approach to calculate the eikonal of a light field at the output of a diffraction grating in the immediate microrelief vicinity. Analytic relations to calculate the diffraction order intensities as functions of the grating step height, line spacing, wavelength of incident light, and incidence angle are deduced. By way of illustration, intensities of the diffraction orders for a blazed reflection grating with a 555-nm operating wavelength utilized in hyperspectrometers are calculated.