Open AccessNon-destructive testing of dielectric layers with defects
Author(s) -
Canan Taşdemir,
O Mudanyali,
Şebnem Yıldız,
Oğuz Semerci,
Ali Yapar
Publication year - 2008
Publication title -
journal of physics conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/135/1/012096
Subject(s) - regularization (linguistics) , dielectric , fourier transform , taylor series , representation (politics) , continuation , mathematical analysis , mathematics , field (mathematics) , nondestructive testing , integral equation , algorithm , computer science , materials science , physics , optoelectronics , quantum mechanics , artificial intelligence , politics , political science , pure mathematics , law , programming language
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