Open AccessA Survey of Surface Reconstruction Techniques for Line Structured Light Systems
Author(s) -
Changwei Wang,
Rui-Yin Tang,
Jing Zhang
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1345/4/042053
Subject(s) - reverse engineering , point cloud , structured light , surface reconstruction , computer science , surface (topology) , line (geometry) , calibration , interference (communication) , data acquisition , system of measurement , production line , engineering , engineering drawing , mechanical engineering , computer vision , physics , telecommunications , mathematics , channel (broadcasting) , geometry , quantum mechanics , astronomy , programming language , operating system
Reverse engineering has been widely used in industrial production, and surface reconstruction technology is the most important part of reverse engineering. Line structure measurement is a non-contact surface measurement method with high precision, low destructiveness, high data acquisition efficiency and strong anti-interference. This paper focuses on the measurement principle of line structured light, system calibration, strip center extraction and point cloud data processing and surface reconstruction. Finally, the existing surface reconstruction techniques that are widely used are summarized.