Open AccessResearch on system testability index allocation of substation digital metering system
Author(s) -
Xiang Wu,
Tianfu Huang,
Zhiwu Wu,
Zhiwei Guo,
Chunguang Wang,
Yang Shu
Publication year - 2019
Publication title -
journal of physics: conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
ISSN - 1742-6588
DOI - 10.1088/1742-6596/1345/3/032082
Subject(s) - testability , scheme (mathematics) , metering mode , reliability engineering , reliability (semiconductor) , design for testing , computer science , index (typography) , engineering , mathematics , mechanical engineering , mathematical analysis , power (physics) , physics , quantum mechanics , world wide web
In the testability engineering of measurement system, if the allocation of testability indicators is not combined with the overall scheme of the system, it will lead to the indicators too high to achieve or too low and thus lack of binding effect. At present, the test scheme for digital metering system can only effectively guarantee the accuracy and reliability of a digital metering device when it runs alone, and can not fully reflect the performance of this device when it runs as part of a complete system. Combining with the digital measurement system of substation, this paper introduces the engineering prediction method into the system, and designs the allocation scheme of testability index and an integrated framework for system-level testability scheme and index allocation. It has reference significance for optimizing the design scheme of testability, reducing the time and cost of testing, and improving the test efficiency.