Open AccessSingle Event Effect Characterization of High Speed Serial JESD204B Data Receiver
Author(s) -
Junze Li,
Suge Yue,
Maoxin Chen,
Xiaojie Song
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1345/2/022016
Subject(s) - single event upset , event (particle physics) , interrupt , computer science , real time computing , embedded system , reliability engineering , computer hardware , static random access memory , engineering , physics , microcontroller , quantum mechanics
This work proposed and discussed a serial JESD204B data receiver and conducted a single event effect test on it. The test is used to analyzed the Single Event Upset (SEU), single Event Latch-up (SEL) and Single Event Functional Interrupt (SEFI). The purpose of the test is to determine if single event effect caused the chip to crash or increase the on-track error rate. The results show that the circuit has a strong ability to resist Single event effect.