Open AccessVO2 thin films for smart windows: Numerical study of the optical properties and performance improvement
Author(s) -
Issam Derkaoui,
Mohammed Khenfouch,
Mohamed Benkhali,
A. Rezzouk
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1292/1/012010
Subject(s) - transmittance , vanadium dioxide , materials science , refractive index , thin film , molar absorptivity , dielectric , semiconductor , optical conductivity , optics , optoelectronics , drude model , condensed matter physics , nanotechnology , physics
Vanadium dioxide (VO 2 ) have attracted tremendous interest in recent years due to their semiconductor-metal transition near room temperature. In this work, we report numerical simulation of the optical properties of VO 2 thin layers which include the index of refraction, the coefficient of extinction, the reflectance and the transmittance. In this sense, we used the Model of Drude-Lorentz for calculating coefficients at from the optical parameters n and k using the determination of the dielectric constant ε (ω, T). Knowing that the semiconductor-metal transition temperature of VO 2 is 68 °C, the thickness effect on the optical properties of VO 2 thin films has been studied by transmittance simulations. Our results revealed a significant changes in optical properties of VO 2 thin layers, which produces many interesting applications especially for smart windows.