
An energy stabilized post-column electron energy-loss spectrometer for transmission electron microscopy
Author(s) -
Zhiwei Wang,
Shu Hu,
Chao Xu,
D. McMullan,
Jun Yuan
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/126/1/012094
Subject(s) - electron energy loss spectroscopy , spectrometer , electron , energy filtered transmission electron microscopy , transmission electron microscopy , energy (signal processing) , scanning transmission electron microscopy , electron microscope , electron tomography , materials science , reflection high energy electron diffraction , conventional transmission electron microscope , detector , optics , electron spectrometer , transmission (telecommunications) , atomic physics , physics , electron diffraction , diffraction , cathode ray , computer science , nuclear physics , telecommunications , quantum mechanics