Open AccessA comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision
Author(s) -
T. Walther
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/126/1/012091
Subject(s) - energy filtered transmission electron microscopy , monolayer , transmission electron microscopy , monte carlo method , thin film , materials science , optics , spectroscopy , resolution (logic) , wetting layer , scanning transmission electron microscopy , high resolution transmission electron microscopy , electron , spectral line , layer (electronics) , nanotechnology , physics , statistics , mathematics , quantum mechanics , astronomy , artificial intelligence , computer science