Open AccessFatigue Scatter Factor Analysis of Airplane Structures Based on Zero-failure Data
Author(s) -
Junling Wang,
Yongbo Zhang,
Wenjing Shi,
Zhihua Wang,
Yan Huang,
Yi Cui
Publication year - 2019
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/1213/2/022010
Subject(s) - weibull distribution , reliability (semiconductor) , zero (linguistics) , airplane , reliability engineering , test data , distribution (mathematics) , statistics , structural engineering , mathematics , computer science , engineering , mathematical analysis , physics , power (physics) , aerospace engineering , linguistics , philosophy , quantum mechanics , programming language
In the fatigue life test of high-reliability airplane structures, a large number of zero-failure data can be obtained, in which case the fatigue life scatter factor is significantly different from that of complete data. This paper conducted a study to define a scatter factor correction coefficient for normal distribution and two-parameter Weibull distribution under the condition of zero-failure data and derived the difference of the scatter factor under these two cases theoretically. At the same time, in order to analyze the difference, a comparative analysis of numerical simulation results under a certain reliability index is presented. The results show that this method makes full use of the product information under the conditions of zero-failure data to enhance the structures’ fatigue safe life and to meet the practical engineering requirements.